Design of a Simulation and Test System for CCD Controller

In this paper, a simulation and test system designed for a charge-coupled device (CCD) controller is presented. Multiple modules of a CCD controller such as power supply, temperature control module, shutter, and clock-bias generator can be tested by simulation and test system. In addition, a video signal of a CCD detector can be simulated and superimposed with random noise to evaluate the performance of the video sampling circuit of a CCD controller. The presented simulation and test system is successfully used for performance test and low-temperature reliability verification of the CCD controller which is designed for E2V CCD47-20 detector. The test results show that the performance of the CCD controller meets the requirements and can work stably at very low temperatures.