Monte Carlo Evaluation of Single Event Effects in a Deep-Submicron Bulk Technology: Comparison Between Atmospheric and Accelerator Environment

In this work, the expected SEE rate in a generic model of a state-of-the-art SRAM memory was studied as a function of the critical charge in different radiation environments. The FLUKA Monte Carlo code was used to evaluate the SEE mono-energetic cross section for different particles as well as the SEE rate in different mixed field environments through an energy deposition analysis. Mono-energetic cross sections for protons and both positively and negatively charged muons were evaluated in the 0.1-1000 MeV energy range. The SEE rate was calculated for different mixed radiation field environments such as the terrestrial environment, commercial flight altitude, LHC critical areas for electronics and CERN's CHARM test facility. Results show that direct ionization from charged particles becomes predominant between 0.2-1.1 fC compared to indirect neutron energy deposition. Finally the CHARM facility was demonstrated to be able to reproduce with a good approximation both the atmospheric and accelerator environments, particularly with regard to avionics, ground level applications and LHC.