Initial In-Flight Error Rates for 16-MB SRAM as Flying on the Double Asteroid Redirection Test (DART) Mission

In-flight static random access memory (SRAM) single bit error (SBE) rates are compared to a series of rate prediction methods in an effort to demonstrate methods for uncertainty propagation and reduction. Supplier ground test data are statistically processed via Monte Carlo methods and considering detailed 3-D spacecraft-level geometries. In-flight rates are considered for the UT8R4M39 SRAM flying in NASA’s Double Asteroid Redirection Test (DART) spacecraft avionics single board computer (SBC) prior to impacting the asteroid Dimorphos.