Variability Study of Toggle Spin Torques Magnetic Random Access Memory

With the process node further scaling down, the bit cell of magnetic random access memory (MRAM) device suffers from severe failure and reliability problems due to its process variation. In this article, we explored the variability of a promising toggle spin torques MRAM (TST-MRAM) in detail, which achieves ultrafast switching speed and high endurance and is expected to be applied as upper-level caches. Our research is conducted with a 14 nm FinFET design kit, the basic performance of TST-MRAM and different pulse conditions are explored, and then the variation effect of device parameters is discussed and compared in detail as well as the write error rate (WER) under different voltages. The results demonstrate that the variation of access transistors dominates the variability, where the transistor in the spin–orbit torque (SOT) branch has a greater negative impact than the transistor in the spin transfer torque (STT) branch. To further reduce WER, a better structure with diodes of bit cell is proposed.