A Low-Power High-Stability Flexible Scan Driver Integrated by IZO TFTs

This brief presents a low-power high-stability scan driver integrated by In-Zn-O (IZO) TFTs on polyimide substrate. Observed from the experimental results of the scan driver with 48 stages, there is no distortion and good noise-suppressed characteristics for the output waveforms. In one stage of the proposed scan driver, there only needs a small TFT connected to clock signals by using a feedback inverter and a dc output module to minimize the dynamic power consumption. It is measured that the power consumption for one stage of the proposed gate driver is 18.3 μW at the output swing of 15.3 V and the clock frequency of 50 kHz. There is a good noise-suppressed characteristic and high stability for the proposed scan driver as shown from a 300-h test.