A Multiresolution Time Domain (MRTD) Method for Crosstalk Noise Modeling of CMOS-Gate-Driven Coupled MWCNT Interconnects

In this paper, the multiresolution time domain (MRTD) method with its unique features is tailored for modeling interconnects. To build further credence to this and its profound existence in the recent state-of-the-art, simulations for inclusive crosstalk noise, on complementary metal-oxide semiconductor gate-driven mutually coupled multi-walled carbon nanotube interconnect lines, using MRTD method and conventional finite-difference time-domain (FDTD) model for 32-nm technology are executed. The results demonstrate the dominance of MRTD model over conventional FDTD in terms of accuracy with respect to recursive simulations of Synopsys HSPICE tool. An average error of less than 0.2% is observed in the estimation of dynamic crosstalk noise analysis. The proposed method is used to model interconnects with two and three mutually coupled lines and can be extended for N-coupled lines. The results of the transient analysis prove the efficiency of MRTD method over HSPICE with respect to computational time. The proposed method can also be used to address the issues of electromagnetic compatibility and electromagnetic interference of on-chip interconnects.