I. Introduction
The frequency range of electromagnetic compatibility (EMC) tests is continuously increasing due to the increase of electronic equipment operating frequencies. Furthermore, smaller electronic devices, such as an integrated circuit (IC), act as efficient antennas at higher frequencies due to their smaller physical dimensions. On the IC level, the electromagnetic (EM) radiated emission and immunity tests are performed using IC-Stripline [1], [2]. The IC-Stripline method presents the improvement over the transversal electromagnetic (TEM) cell method in terms of cost, sensitivity, efficiency, and the operating frequency range. Compared to the TEM cell, higher order modes are shifted to higher frequencies because of smaller physical dimensions. For the same level of the input power the IC-Stripline will generate larger electric field without using costly RF amplifiers.