Generation and EMC Optimization of Compact Equivalent Electrical Circuits of Industrial Electronics

Electromagnetic compatibility (EMC) analysis of complex electronic devices is a time-consuming task in the industry. Physically motivated resistive, inductive, and capacitive (RLC) models greatly expedite the analysis. But up to date methods available to extract them from 3-D simulation models generate RLC models which contain too many elements to be easily interpreted. In this article, we combine a method for RLC extraction which is known to generate comparably small equivalent electrical circuits with an adjoint sensitivity analysis for further reduction. The resulting circuit explicitly contains only functional and relevant parasitic elements. We demonstrate that EMC analysis and subsequent optimization becomes feasible by applying the method to two hardware samples provided by the Robert Bosch GmbH.