Failure Scenario of Power Supply Due to Conducted Electric Pulse From E1 HEMP

This article presents the effects of a high amplitude conducted electromagnetic pulse on the electrical behavior of a flyback switch-mode power supply. The electromagnetic pulse is generated by a current injection platform that is able to reproduce differential or common mode parasitic currents and voltages induced by the coupling between E1 high-altitude nuclear electromagnetic pulse and a global electrical network. In this article, injections are performed in differential mode until the destruction of power supply. Current and voltage measurements have been performed around each destroyed component during the injection. Finally, these destruction tests, associated with spice simulations and component analyses, permit to build a power supply destruction scenario with the component's failures chronology modeling. This scenario is the first step in order to model the susceptibility of power supplies during an electrical pulse injection.