A Method for Simulating Mixed-Signal ATE Tests

It has never been practical to simulate production tests of mixed-signal ICs, except for the smallest ones. As a result, tests are written in the language of the intended automatic test equipment (ATE) and debugged on the ATE with (possibly defective) ‘first silicon’ devices – this typically requires months of effort. This paper shows why and how the Procedural Description Language (PDL) defined by IEEE P1687.2 can be used for writing tests that can be simulated before automatically and reliably translating them into ATE code. Examples are provided of automated translation to simulation testbenches that are compatible with manufacturing test limitations, as well as an example translation to (previously) digital-only IEEE 1450 STIL.