Switching ECC Techniques with Decimal Matrix Code and Diagonal Hamming Code

The semiconductor memories in an electronic circuit is used to store the binary information fed into it. In the present scenario, with the increase in the density of the digital circuit per mm2 area any slight variation in the powersupply causes MCU's (Multiple Cell Upsets) in the memory these are called soft errors which are temporary and can be corrected using EDAC (Error Detection and Correction Codes). In this research study, Decimal Matrix Code (DMC) for MBU's(Multiple Bit Upsets) detection and correction is selected and further analyzed by taking 32-bit data length arranged in two configurations 8×4 and 4×8 respectively. It was found that, the4×8 configuration also has multi bit error correcting capability for unique error patterns which are listed as Type 6 errors under 4×8 configuration and also with reduced overhead of 18.75% than the existing model. In this research study, the new error pattern of failure case in DMC technique is identified and has overcome by using switching technique with diagonal hamming method.