A New High-efficient Burn-in Screening Methodology Applied in Automotive Integrated Circuits Reliability

In order to ensure the extremely high reliability of automotive products, Burn-In (BI), as a kind of essential technical means for screening early failures caused by potential defects, is usually applied in the electronic components of the automobile system before putting into use. However, the general BI screening only uses Final Test specification for failure judgment and does not establish a systematic screening standard. This paper proposes a new BI screening methodology, which considers the different degradation behaviors of Vmin/∆Vmin in high-temperature working life (HTOL) and BI test through a series of multilevel BI experiments with different stress voltages and screening times. The quantitative relationship between BI screening and Vmin/∆Vmin degradation is established, and reasonable auxiliary screening specification are determined. This strategy can effectively reduce the early failure rate (ELFR) of automotive devices and achieve mass production in the future.