Bulk Current Injection (BCI) Simulation and Measurement Correlation of an Automotive Battery Cell Voltages and Temperature Monitor IC

Bulk current injection (BCI) testing standard (ISO11452-4) assesses the immunity of a device under test (DUT) and its associated wiring harness to electromagnetically induced disturbance. The ISO11452-4 standard specifies two BCI test methods: the substitution (open-loop) and current monitoring (closed-loop) probe methods. This work develops a system-level modeling methodology to predict an integrated circuit (IC) device immunity performance under closed-loop BCI testing. The coupled transient circuit-to-electromagnetic modeling scheme is validated against direct silicon measurements on an automotive battery cell voltages and temperature monitor IC setup. Overall, a relatively good correlation was seen between simulation and measurement - validating the integrity of the predictive modeling methodology for closed-loop BCI testing.