Heavy-ion and proton characterization of AMD 7nm Versal™ multicore scalar processing system (PS)

This paper presents the single event response of Xilinx’s 7nm Versal ACAP dual R5 and dual A72 ARM core processor system (PS) for Space applications. The PS was evaluated using Xilinx’s System Validation Tool (SVT) design suite. Accelerated particle beam test of a XCVC1902 device was performed using the heavy-ion source at Berkeley BASE and proton sources at Crocker Nuclear Laboratory (CNL) and Triumf. More than 10 million designs exercising all the PS power domains were generated during the test. The PS single-event results are presented and categorized in terms of detectability and correctability. No SEL was observed in the PS up to a LET of 80 $\mathrm{MeV}-\mathrm{cm}^{2} / \mathrm{mg}$, 110° C and VCCmax values. With all PS safety mechanisms enabled, beam test results show that the overall PS SEFI rate in GEO is 0.16 SEFI per year and 1 SEFI per year (at 500 km and 51.6° inclination) in LEO. Also, no uncorrectable events were observed in the PS caches and RAMs.