Single Event Upset sensitivity analyses and prediction based on methodology from design to operational risks

This work presents a methodology to analyze and estimate the soft error rate of a digital device for aircraft and automotive applications. This methodology is based on simulation platforms relating to the SET/SEU simulation at cells and circuits levels (RAPTOR), and physical atmospheric cosmic-ray showers simulations (ATMOS CORE). The methodology is applied on the SRAM cell of the Microchip Rad-Tolerant product SAM3X8RT, considering realistic flights/ground environments for quiet solar conditions and extreme solar event. Results demonstrate the interest of coupled approaches and show the importance to consider realistic flight and physical model to assess SERs.