Research on time parameter measurement technology of digital integrated circuit based on FPGA

Integrated circuit testing plays a crucial role in various stages of integrated circuit design verification, product inspection, and on-site maintenance, serving as an essential means of ensuring that the logical functionality and dynamic parameter indicators of integrated circuits meet technical requirements. This article focuses on the research of digital integrated circuit time parameter testing techniques based on FPGA. Firstly, the construction of the system's hardware platform is completed, utilizing the method of building delay lines on FPGA chips to measure time intervals and designing the hardware circuit of the system's time interval measurement unit. Then, the writing process and methods of ARM9 driver programs for each measurement item in time parameter testing are discussed in detail. Finally, the verification work of the system's hardware dynamic performance is accomplished. Through the digital integrated circuit time parameter test, and measurement results are provided. The results indicate that the dynamic performance and indicators of the system in this article are good, with small measurement errors and meeting the testing requirements to a large extent.