Common Mode Noise Analysis inside the Integrated Circuits

In order to model the common mode (CM) noise source inside the integrated circuit (IC), many circuits combing real tests have been proven effective. However, the accuracy of the extract method from the test to the model is a key problem that limits the application of the inside source. In this paper, a smart transfer circuit has been developed to extract the common mode source. The results show that this method can recover the source wave very accurate. Meanwhile, using the CM source, we can forecast the 3M RE result from the PCB trace radiation.