A Digital Gate Driver IC with Active Gate Waveform Calibration Technique Achieving Switching Loss Reduction by 24% and DESAT Turn-off Arbitrary Waveform Memory for Overcurrent Protection Targeting 1200V SiC MOSFETs

A digital gate driver IC with drive pattern generation calibration technique is proposed for dependable SiC application. The proposed calibration utilizes an on-chip ADC to generate waveforms that break the trade-off between current surges and losses at multiple voltages and currents, reducing losses by 23%. Proposed DESAT with active gate allow turn-off at any driving force when overcurrent is detected. The pulse extender supports any pulse width of PWM and reads out memory.