Improving Productivity and Efficiency of SSD Manufacturing Self-Test Process by Learning-Based Proactive Defect Prediction

In the recent storage market, Flash-based Solid State Drives (SSDs) have become high-performance alternatives to Hard Disk Drives (HDDs), dramatically increasing SSD shipments. To guarantee product reliability and quality to remain competitive, SSD manufacturers pay significant efforts in technology qualification and reliability design, especially in Manufacturing Self-Test (MST) processes. However, the cost of the MST process becomes more prominent as the memory density of SSD increases. In this paper, we study the MST data in over 20,000 SSDs and propose a novel and economical approach to dynamically reduce the MST overhead by proactive infant defect prediction based on Generative Adversarial Network-Attention based Spatial-Temporal Sequence-to-Sequence network (GAN-ASTSeq). It reduces the temporal cost by 80.2% (i.e., improves the efficiency by 4×) while maintaining an outstanding detection rate of defects.