A Fault Detection Method for Missing Gate Faults in Reversible Circuits Using Binary to Gray Code Conversion

Reversible computing has a remarkable ability to reduce heat dissipation in computing machinery. It can be broadly applied in various fields, which include Digital signal processing, Cryptography, DNA computing, Network congestion, Database transactions, Quantum computing, etc. Fault detection is a complicated and demanding problem in reversible circuits. Fault detection is an essential process in the field of testing to ensure the reliability and integrity of the circuit. This paper proposes a straightforward approach for Single Missing Gate Fault (SMGF), Multiple Missing Gate Fault (MMGF), Repeated Gate Fault (RGF) and Partial Missing Gate Fault (PMGF) under the Missing Gate Fault (MGF) model. The method includes the process of binary to gray code conversion in order to determine the total number of test vectors to detect the respective MGFs. Experimental results are performed on reversible benchmark circuits to evaluate the number of test vectors required to recognize all the MGFs. The comparative analysis of the proposed work with the existing work is also presented.