Evaluating the Robustness of SRAM Physical Unclonable Functions: Empirical Investigations

This paper comprehensively explores the reliability of Static Random-Access Memory (SRAM) Physical Unclonable Functions (PUFs) in hardware security applications. It provides an overview of SRAM PUFs, their importance in hardware secu-rity, and their key characteristics. The paper discusses evaluation metrics, assessment methods, and experimental analysis of an 8-bit SRAM dataset based on various environmental factors, along with the challenges faced. It surveys existing literature and the methodologies used with comprehensive insights from the analysis. Factors influencing SRAM PUF reliability, such as environmental conditions, aging effects, and process variations, are identified and explained. The survey covers reliability analysis techniques, tools, mitigation techniques, and countermeasures. The paper concludes by summarizing key findings, emphasizing the importance of reliable hardware security, and suggesting future research directions for enhancing SRAM PUF reliability.