Investigating the Effect of Electromagnetic Fault Injections on the Configuration Memory of SRAM-Based FPGA Devices

This paper presents an analysis of the impact of Electromagnetic Fault Injections (EMFI) on the behaviour of Field-Programmable Gate Arrays (FPGA). We investigate how EMFIs affect the FPGA's configuration memory and fabric. Using a specialized EMFI apparatus and a custom-built test bench, we perform a series of tests and discuss the accuracy and precision achieved with this equipment and its impact on device security. Furthermore, we use the FPGA's readback capability along with bitstream reverse-engineering techniques to analyze and confirm the impact of EMFIs.