Abstract:
This paper proposes a method to use the sensitivity information for efficient uncertainty quantification using the Least Squares-Support Vector Machine (LS-SVM) framework...Show MoreMetadata
Abstract:
This paper proposes a method to use the sensitivity information for efficient uncertainty quantification using the Least Squares-Support Vector Machine (LS-SVM) framework. The inclusion of the sensitivity information in the LS-SVM framework allows us to reduce the number of simulations. Finally, the proposed approach is verified with use of an circuit example with 25 random parameters.
Published in: 2023 IEEE 32nd Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
Date of Conference: 15-18 October 2023
Date Added to IEEE Xplore: 16 November 2023
ISBN Information: