A Robust and High-Performance Flip-Flop with Complete Soft-Error Recovery

The aggressive shrinking of CMOS makes flip-flops (FFs) vulnerable to single-node upset (SNU) as well as double-node upset (DNU). SNU and DNU are typical soft errors. This paper presents a highly reliable and low delay FF providing complete DNU-recovery. Simulations show the complete DNU-recovery as well as low-delay for our proposed FF making the FF suitable for high-robustness and high-performance applications.