Reliability and Availability Analysis for Electronic Circuit Design

This paper provides a reliability, availability and Mean Time Between Failure (MTBF) analysis for a sample DC/DC converter and Discrete I/O electronic circuit stages. These analyses were performed using the Failure Tree Analyses (FTA) approach. The reason for choosing these structures is that they are frequently used in today's electronic design. In this study, the effect of the importance of reliability on the whole system, starting from a component in electronic circuit design, has been demonstrated.