Simulation Analysis of the Bit Error Induced by EMI on Galvanically Isolated Data-Link Embedded in an Automotive Battery Management IC

In this paper, the susceptibility to electromagnetic interference (EMI) of a battery management system (BMS) used in electric vehicles is addressed. In particular, the effects of EMI on the BMS vertical interface (VIF), i.e., the galvanically isolated data link between different BMS modules are analyzed by transistor-level simulations with reference to direct power injection (DPI) and bulk current injection (BCI) test conditions for the first time. Based on the simulations, the DPI and BCI susceptibility levels of two different VIF architectures are estimated, and different failure mechanisms are highlighted.