Leveraging Reconfigurable DIO Test Instruments for Multiple Applications

Modular Open Systems Approach (MOSA) initiatives for military systems are driving the need for box-level and circuit card-level functional testing to verify requirements for interoperability and compliance to open architecture standards. Reduced physical access due to size, weight, and power (SWaP) design requirements have led to miniaturization of electronics and increased PCBA complexity elevating the importance of functional testing. The mission-critical nature of military and aerospace electronics also makes functional testing an imperative at both Factory and Depot levels. Modern digital test instruments require compliance with standard test instrumentation architectures such as PXIe and must meet industry demands for lower cost, smaller footprint, and modularity. PXIe digital test instruments need to employ technology which allows channel specific control of voltages and timing to meet today's modern industry UUT functional test requirements. Next generation, reconfigurable digital I/O test instrumentation provide functional test solutions for MOSA-compliant modular assemblies that are flexible and allow reuse of the same instrument for multiple test applications on the same UUT. For common ATS, these solutions are cost-effective and promote reuse and portability of test functions and test code across multiple TPSs, simplifying test development and reducing cost and schedule risk.