Automatic Test System for HPM Effect Injection Experiment

Microwave effect experiment is an important means to study the threshold of core electronic components of electronic equipment. In view of the characteristics of traditional microwave effect experimental platforms, which are mostly suitable for single parameter test, cumbersome process and low efficiency. This paper describes a high power microwave (HPM) effect automatic test system with multiple functions, such as one key test, multi parameter extraction, real-time test data acquisition, automatic analysis of test results and so on. Experiments show that the automatic test system can provide experimental data support for the study of electromagnetic effect mechanism and electromagnetic protection scheme of HPM on semiconductor devices and electronic circuits.