Physics-based and Behavioural Models for the Dynamic Response of a TVS Diode

Prediction of the dynamic response of ESD protections is necessary for system-efficient ESD design (SEED). This paper proposes two models reproducing the features of the dynamic response of a transient-voltage suppressor (TVS) diode subjected to transmission-line pulses (TLP). A physical model including bipolar operation, avalanche and conductivity modulation along with the various delays associated with the build-up of charges in the structure is shown to capture all key features of the dynamic response. A behavioural model, focussed on the activation process and conductivity modulation achieves comparable results.