A Real-time Microwave Camera Prototype with Zero-bias Diode Detectors for EMI Source Imaging

Emission source microscopy (ESM) could be utilized to localize the Electromagnetic Interference (EMI) sources that contribute to the far-field radiation. In those cases, the electrical field over a two-dimensional plane is collected by mechanical scanning, resulting in a long measurement time and the presence of mechanical errors. In this work, a microwave camera based on a two-dimensional array of elliptical slot antennas and diode detectors is presented. Multiplexers are utilized to access the output of each detector and the scanning of the whole array could be done multiple times per second.