On the Sensitivity of RCS to Manufacturing Defects in as-built Camera Boxes with Voids

A recently introduced benchmark structure is used to investigate the sensitivity of electromagnetic scattering to manufacturing imperfections in metallic structures with voids. Three versions of the cobra-in-a-camera-box benchmark are modeled: one exactly according to the benchmark specification and others with minor/major geometric perturbations in the vicinity of the aperture. Simulation results show that even minor perturbations can impact the scattered far fields significantly, the effect varies with frequency and look angle, and the largest effects are at higher frequencies and at void-aware look angles.