FePd Single Layer and Synthetic Antiferromagnet with Low Damping and Crystalline Perpendicular Magnetic Anisotropy on Amorphous Si/SiO2 Wafers

(001)-textured L1
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-phase FePd possesses strong crystalline perpendicular magnetic anisotropy (PMA) and low Gilbert damping constant and thus, is considered a promising material choice for scalable spintronic devices. To date, however, well-textured L1
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-FePd(001) thin films can only be prepared on a few expensive substrates, which directly impedes their industry compatibility and application prospect. In this digest, we report the deposition of L1
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-FePd(001) single layer and synthetic antiferromagnet (SAF) on industry-ready Si/SiO
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wafers with large PMA, low damping, and strong antiferromagnetic interlayer exchange coupling. The microstructures of L1
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-FePd(001) single layer and SAF were imaged using scanning transmission electron microscopy. We observed sharp and flat interfaces between each layer as well as the heteroepitaxial growth of sample stacks, which explains the high performance of the samples.