Research on Testing Technology of Embedded Processor Cache Controller in Programmable SoC

With the progress of Integrated Circuit technology and the multiple needs of human for scalar and reconfigurable operations in intelligent electronic system, a new chip architecture combining traditional FPGA and embedded processor appears, namely programmable SoC. Programmable SoC products have been widely used in mission and safety-critical applications, but production defects in hardware and time-related defects in the working process often lead to system misbehavior, which leads to disastrous consequences. Therefore, in view of the long-term reliability application requirements of programmable SoC products, it is necessary to carry out relevant research on its in-field test technology. In this paper, we will use the Software-Based Self Test (SBST) method to explore and implement the function of data cache controller for Zynq-7000 series Programmable SoC embedded processors (Enable\Disable, Invalidate, Clean) test technology research. By making full use of the fully programmable features of hardware and software resources in Zynq-7000, we have respectively realized the test generation technology based on PS and the test observation technology based on PL, and designed the prototype test system. Finally, the experimental results show that the prototype test system meets our expectations and can realize the in-field test of the cache controller of the embedded processor in the Zynq-7000 series programmable SoC. At the end of this paper, we summarize the work done and look forward to the future research direction.