Characteristics of Secondary Electron Emission from Textured Structure Surface

The secondary electron emission (SEE) of microwave device materials is an important physical process affecting the micro-discharge effect of components. The surface structure design applied to reduce SEE has increased year by year, but there are few reports on the surface simulation of textured structures. In this paper, the Monte Carlo (MC) model of SEE on metal surface is used to realize the Monte Carlo simulation of the secondary electronic yield (SEY) of some specific textured structure surface, which provides a reference for the design of textured structure surface, and has important application value for studying the mechanism of SEE and suppressing micro-discharge effect.