The First-principles Calculations of Composite Interfaces for a Robust Correction of Monte Carlo Simulation on Secondary Electron Yield

The multipactor effect in the microwave components of spacecrafts and satellites can be faded and prevented by suppressing the secondary electron emission (SEE) on the material surface. For many decades, researches on the suppression of SEE have been ongoing and vigorous. Among them, the Monte Carlo simulation on secondary electron yield (SEY) is a low-cost and efficient approach to investigate the SEE, which can improve the theoretical description of physical process for experimental researches and further give a prediction of new experimental results. In order to match and follow up specially designed multilayer film process used in practical engineering, a correction factor involved with emitting probability for the Monte Carlo simulation on secondary electron emission of multilayer thin films was studied in this paper. Based on the first-principles calculations, some microscopic results of several composite interfaces including vacuum potential distributions have been figured out, which can be subsequently applied to a robust correction for Monte Carlo simulations of SEY for the corresponding multilayer thin films.