Study of linearity indices in analog/RF circuits using EKV model and comparing the results in three different CMOS processes

The paper reports on a reliable design methodology for linearity of analog/RF circuits based on EKV model and its main parameter, the inversion coefficient (IC). In this procedure, the linearity value is studied in all regions from WI to SI. Two important linearity indices, AldB and AIP3, are investigated for single-stage and two stage differential amplifiers and finally the optimum value of inversion coefficient is calculated for biasing of circuit devices.