Overview on the Effects of Mission Profiles on Radiation Induced Failures in All-Electric Aircraft

Radiation induced failures of power semiconduc-tors are one of the largest challenges in realizing all-electric aircraft. Both the high flight altitude and the large total chip area resulting from the high power requirements will massively increase the failure rate compared to ground applications of power electronics systems. This paper gives an overview on the mechanism of radiation-induced failures and illustrates the effect of different mission profiles on the failure rate.