Mean Estimation and Nominal Device Selection with the Pairwise Midpoint Method

Accurate characterization of electrical device behavior is a key component of developing accurate electrical models and assessing reliability. Measurements characterizing an electrical device can be produced from current-voltage (I-V) sweeps. We introduce the pairwise midpoint method (PMM) for estimating the mean of a functional data set and apply it to I-V sweeps from a Zener diode. Comparisons indicate that the PMM is a viable method for describing the mean behavior of a functional data set.