Size Scaling of Brittle Strength using Multi-Mode Weibull Distribution

This paper presents a numerical method to determine optimal parameters of the Integral-based multi-mode Weibull distribution. Its performance and resulting distribution are compared with S
max
-based multi-mode Weibull distribution, fitted for the same bending testing data. The advantage of this new method is demonstrated by its ability to predict failure rates due to chip corner cracks that are caused by highly localized stress distribution.