Test socket for microwave integrated circuits

Today, for mass-produced radio-electronic products, the task of improving the quality of products in the struggle for the end user is relevant. There are no test sockets (TS) for integrated circuits on the domestic market which allow measuring characteristics at frequencies above 18 GHz, and the purchase of foreign samples in the current realities is problematic. In this paper, a study of options for creating spring-loaded contact models has been conducted and based on them, a TS operating in the frequency range up to 40 GHz has been developed. Measurements of the electrical characteristics of the microwave integrated circuit were carried out using the developed TS, and the results confirming the operability of this TS were obtained.