The advantages of surface susceptibility model over surface impedance model in characterizing metasurfaces

Surface Susceptibility Model (SSM) and Surface Impedance Model (SIM)) are two kinds of homogenization models of metasurfaces. This study provides the mathematical relations of SSM and SIM, followed by scattering parameter calculation of metasurfaces’ unit cells by using the two models. A numerical experiment compares the performance of the two models and shows that SSM is more efficient than SIM in terms of evaluating oblique incident situations and saving analyzing time.