Parameters Estimate of Step-Stress in Accelerated Life Tests of Exp. Distribution with Type I Censor

The extensive use of electronic devices automatic mixing and simulation, the high quality of the manufacturing process has improved greatly, making the merchandise more reliable than its previous versions, obtaining failure data using normal failure life time testing is a time consuming and expensive process for such high reliability merchandise, Therefore, more complex tests are used, which are the Accelerated Life Testing, they are tests: Constant Accelerated Life Testing and Step Stress Accelerated Life Testing, which is the subject of our study. The step-stress model of the exponential distribution was studied in the presence of type I censoring data, and the model parameters were estimated using the maximum likelihood method for both parameters (the scale parameter of the exponential distribution, and the stress factor), and then estimating the confidence interval and calculating the variance and covariance.