Acoustic Emission Testing of Multilayer Ceramic Capacitors

A new technique for detecting physically defective multilayer ceramic capacitors is described. This technique is based upon the acoustic energy emitted when a defective device is subjected to compressional stress. Strong correlation is shown between the acoustic energy emitted and the severity of physical defects as determined through destructive physical analysis. In addition correlation is shown between the presence of physical defects and abnormal performance during accelerated life tests.