Performances of conventional thick-film resistors subjected to mechanical straining

In this paper the results from a study of mechanical straining effects on reversible resistance changes, gauge factor and noise index of thick-film resistors based on three different resistor compositions with sheet resistances of 1k/spl Omega//sq, 10k/spl Omega//sq and 100k/spl Omega//sq are presented. For the experimental purposes thick-film test resistors of different dimensions were realized. Resistors were subjected to mechanical straining with maximum deflection of 400/spl mu/m. Obtained experimental results were analyzed and correlation between resistance, gauge factor and noise index changes with resistor degradation due to mechanical straining were observed.