Abstract:
We analyze a transient current testing technique that measures and computes the charge delivered to the circuit during the transient operation. The method was applied to ...Show MoreMetadata
Abstract:
We analyze a transient current testing technique that measures and computes the charge delivered to the circuit during the transient operation. The method was applied to 0.5 /spl mu/m CMOS SRAMs that passed various logic tests. Results indicate that charge based testing (CBT) can successfully test submicron ICs since it tolerates large and variable background currents, can be applied to non-fully static circuits, and clearly shows outlier parts. CBT is a sensitive physical test correlating transient charge injected to the properties of particular transistors that switch during selected patterns. This gives CBT an efficient diagnostic capability. A compact hardware module to compute CBT was demonstrated previously.
Published in: Proceedings. International Test Conference
Date of Conference: 10-10 October 2002
Date Added to IEEE Xplore: 10 December 2002
Print ISBN:0-7803-7542-4
Print ISSN: 1089-3539