An Efficient Technique for the Analysis of Large Multilayered Printed Arrays

In this letter, we present an efficient technique based on the extension of the adaptive integral method (AIM) that allows the full-wave analysis of electrically large multilayered printed arrays that have one or more planar metallizations and vertical conductors. The array patches can be of arbitrary shape and orientation and are modeled with subdomain triangular basis functions. This method makes use of a 2D-FTT/CG scheme, reducing the CPU time per iteration to O(N log
₂
N) and the memory requirement to O(N).