Surface morphology of (Hg,Re)Ba/sub 2/CaCu/sub 2/O/sub y/ thin films prepared by pulsed laser deposition

(Hg,Re)Ba/sub 2/CaCu/sub 2/O/sub y/ thin films have been fabricated on [100] LaAlO/sub 3/ by reacting laser deposited Re/sub 0.2/Ba/sub 2/CaCu/sub 2/O/sub y/ precursor films with CaHgO/sub 2/ in sealed quartz tubes at 780/spl deg/C for times ranging between 0 h -16 h. The films reacted for more than 2 h exhibit high phase purity (Hg,Re)-1212 and good c-axis texture. Scanning electron microscopy and x-ray diffraction studies showed the existence of small amounts of a-axis oriented grains in all the reacted films. The root-mean-square roughness, measured by atomic force microscopy (AFM), increases initially with increase in heat treatment duration and saturates at /spl sim/300 nm after 4 h. The evolution of the surface roughness can be partially explained with a high nucleation density and the appearance of a three-dimensional structure during the initial stages of film growth and crystal coalescence at further growth. Two-dimensional planar growth with a one-unit-cell growth unit in the c direction was observed by AFM.