Effect of the device size on the performance of resonant-tunneling diodes

Presents experimental results obtained with resonant-tunneling diodes fabricated from (GaAl)As/GaAs and (CdMg)Te/CdTe semiconductor heterostructures grown - respectively - by low-pressure metal-organic vapor-phase epitaxy and molecular-beam epitaxy methods. These results demonstrate, firstly, the appearance of intriguing oscillatory structure on the rising slope of the resonant peak in small-diameter (GaAl)As/GaAs-based devices and, secondly, the improvement of current-voltage characteristics of (CdMg)Te/CdTe-based resonant-tunneling diodes due to reduction of their cross-sectional area.