Some models and methods for fault diagnosis of analog piecewise linear circuits via verification technique

The paper deals with some fault diagnosis methods of analog piecewise linear circuits based on verification technique. Three various methods, based on the component connection model, the multiport hybrid model and the Tableau model, have been presented. An efficiency of several models with particular considerations of a diagnosis time and complication of diagnostic equations formulation has been analysed. Theoretical considerations have been illustrated by examples of a single and a double fault diagnosis of a three-stage transistor amplifier.