Active-Edge planar silicon sensors for large-area pixel detectors

We study the influence of active edges on the response of edge pixels by comparing simulations of the electrostatic-potential distribution to position-defined measurements on the energy deposition. A laser setup was used to measure the edge-pixel response function and shows the sensitive edge is only about 2 μm from the physical edge. 3D reconstruction of tracks from high-energy pions and muons, produced at the SPS H6 test beam facility at CERN, enabled to relate the energy deposition at edge pixels to the particle's interaction depth. A clear correlation is observed between the simulated electric-field distortion and the reconstructed interaction-depth dependent effective size.